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Absolute lattice parameter measurements of epitaxial layers

✍ Scribed by Fewster, P. F.

Book ID
114499417
Publisher
International Union of Crystallography
Year
1982
Tongue
English
Weight
317 KB
Volume
15
Category
Article
ISSN
0021-8898

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## Precision Lattice Parameter Measurements of WE-Gap-Epitaxial Layers by the Wmweganregung" Method The "Umweganregung" technique according to a method described by SPOONER and WIL-SON was used for the accurate measurement of lattice parameters of (100) slice of VPEgrown layers of gallium phosphid