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X-ray triple-crystal diffractometry of defects in epitaxic layers

✍ Scribed by Holý, V. ;Wolf, K. ;Kastner, M. ;Stanzl, H. ;Gebhardt, W.

Book ID
114500853
Publisher
International Union of Crystallography
Year
1994
Tongue
English
Weight
695 KB
Volume
27
Category
Article
ISSN
0021-8898

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## Abstract Analytical expressions for coherent and diffuse scattering intensities with account for imperfections in all the crystals of double‐ and triple‐crystal diffractometers (DCD and TCD) have been derived from the generalized dynamical theory of X‐ray scattering in real single crystals which