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Characterization of porous InP(001) layers by triple-crystal X-ray diffractometry

✍ Scribed by A. A. Lomov; D. Yu. Prokhorov; R. M. Imamov; D. Nohavica; P. Gladkov

Book ID
111437639
Publisher
SP MAIK Nauka/Interperiodica
Year
2006
Tongue
English
Weight
302 KB
Volume
51
Category
Article
ISSN
1063-7745

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## Abstract A high resolution X‐ray diffraction method has been effectively used for the structural characterization of InP porous layers. It was revealed that strong diffuse scattering from pores around reciprocal lattice points does depend on the azimuth positions of samples. To extract structura