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Characterization of the structure of porous germanium layers by high-resolution X-ray diffractometry

✍ Scribed by A. A. Lomov; V. A. Bushuev; V. A. Karavanskii; S. Bayliss

Book ID
110134058
Publisher
SP MAIK Nauka/Interperiodica
Year
2003
Tongue
English
Weight
275 KB
Volume
48
Category
Article
ISSN
1063-7745

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## Abstract A high resolution X‐ray diffraction method has been effectively used for the structural characterization of InP porous layers. It was revealed that strong diffuse scattering from pores around reciprocal lattice points does depend on the azimuth positions of samples. To extract structura