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Lattice constants of Cd1−xZnxTe mixed compound semiconductor

✍ Scribed by Hirata, K.; Oda, O.

Book ID
122825742
Publisher
Elsevier Science
Year
1986
Tongue
English
Weight
427 KB
Volume
5
Category
Article
ISSN
0167-577X

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Optical Constants of Polycrystalline Cd1
Optical Constants of Polycrystalline Cd1−xZnxTe Thin Films by Spectroscopic Ellipsometry
✍ K. Prasada Rao; O. Md. Hussain; B. Srinivasulu Naidu; P. Jayarama Reddy 📂 Article 📅 1997 🏛 John Wiley and Sons 🌐 English ⚖ 127 KB 👁 2 views

Spectroscopic ellipsometry has been used to determine the optical constants-complex dielectric constant (e\* = e 1 + e 2 ), refractive index (n), extinction coefficient (k), absorption coefficient (a) and normal incidence reflectivity (R)-of two-source vacuum-evaporated polycrystalline Cd 1 Àx Zn x