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Optical properties of Cd1−xZnxTe thin films fabricated through sputtering of compound semiconductors

✍ Scribed by Pushan Banerjee; Rajiv Ganguly; Biswajit Ghosh


Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
258 KB
Volume
256
Category
Article
ISSN
0169-4332

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Optical Constants of Polycrystalline Cd1
✍ K. Prasada Rao; O. Md. Hussain; B. Srinivasulu Naidu; P. Jayarama Reddy 📂 Article 📅 1997 🏛 John Wiley and Sons 🌐 English ⚖ 127 KB 👁 2 views

Spectroscopic ellipsometry has been used to determine the optical constants-complex dielectric constant (e\* = e 1 + e 2 ), refractive index (n), extinction coefficient (k), absorption coefficient (a) and normal incidence reflectivity (R)-of two-source vacuum-evaporated polycrystalline Cd 1 Àx Zn x