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Intrinsic sensitivity of Cd1-xZnxTe semiconductors for digital radiographic imaging

✍ Scribed by Giakos, G.C.; Guntupalli, R.; De Abreu-Garcia, J.A.; Shah, N.; Vedantham, S.; Suryanarayanan, S.; Chowdhury, S.; Patnekar, N.; Sumrain, S.; Mehta, K.; Evans, E.; Orozco, A.; Kumar, V.; Ugweje, O.; Moholkar, A.

Book ID: 114629447
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 307 KB
Volume: 52
Category: Article
ISSN: 0018-9456
DOI: 10.1109/tim.2003.818563

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