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[IEEE 17th IEEE Instrumentation and Measurement Technology Conference - Baltimore, MD, USA (1-4 May 2000)] Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference [Cat. No. 00CH37066] - Contrast sensitivity and dynamic range measurements of CdZnTe semiconductors for direct type flat-panel imaging

✍ Scribed by Giakos, G.C.; Guntupalli, R.; Shah, N.; Vedantham, S.; Suryanarayanan, S.; Chowdhury, S.; Passerini, A.G.; Mehta, K.; Sumrain, S.; Patnekar, N.; Evans, E.A.; Endorf, R.; Russo, F.

Book ID: 118250208
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 312 KB
Edition: 1
Volume: 0
Category: Article
ISBN-13: 9780780358904
DOI: 10.1109/imtc.2000.846889

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