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[IEEE 17th IEEE Instrumentation and Measurement Technology Conference - Baltimore, MD, USA (1-4 May 2000)] Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference [Cat. No. 00CH37066] - SPICE model of thermoelectric elements including thermal effects

✍ Scribed by Chavez, J.A.; Ortega, J.A.; Salazar, J.; Turo, A.; Garcia, M.J.

Book ID: 115541708
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 344 KB
Edition: 1
Volume: 2
Category: Article
ISBN-13: 9780780358904
DOI: 10.1109/imtc.2000.848895

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