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[IEEE 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) - Vail, Colorado, USA (20-22 May 2003)] Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) - Lamp flicker measurement and mitigation

✍ Scribed by Chau-Shing Wang, ; Devaney, M.J.

Book ID: 111690633
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 441 KB
Volume: 1
Category: Article
ISBN-13: 9780780377059
DOI: 10.1109/imtc.2003.1208180

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