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[IEEE 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) - Vail, Colorado, USA (20-22 May 2003)] Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) - A virtual environment for remote testing of complex systems

✍ Scribed by Cristaldi, L.; Monti, A.; McKay, W.; Ferrero, A.; Ponci, F.; Dougal, R.

Book ID: 115466808
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 434 KB
Volume: 1
Category: Article
ISBN-13: 9780780377059
DOI: 10.1109/imtc.2003.1208259

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