Latchup performance of retrograde and conventional n-well CMOS technologies

✍ Scribed by Lewis, A.G.; Martin, R.A.; Tiao-Yuan Huang; Chen, J.Y.; Koyanagi, M.

• Book ID: 114596100
• Publisher: IEEE
• Year: 1987
• Tongue: English
• Weight: 973 KB
• Volume: 34
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1987.23211