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[Japan Soc. Appl. Phys 2002 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2002) - Kobe, Japan (4-6 Sept. 2002)] International Conferencre on Simulation of Semiconductor Processes and Devices - Characterization of multi-barrier tunneling diodes and vertical transistors using 2-D device simulation

โœ Scribed by Kwan-Do Kim, ; Keun-Ho Lee, ; Seung-Jae Baik, ; Jun-Ha Lee, ; Tai-Kyung Kim, ; Jeong-Taek Kong,


Book ID
120541952
Publisher
Japan Soc. Appl. Phys
Year
2002
Tongue
Japanese
Weight
261 KB
Category
Article
ISBN-13
9784891140274

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