𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Isoelectric Point of Fluorite by Direct Force Measurements Using Atomic Force Microscopy

✍ Scribed by Assemi, Shoeleh; Nalaskowski, Jakub; Miller, Jan D.; Johnson, William P.

Book ID
126854262
Publisher
American Chemical Society
Year
2006
Tongue
English
Weight
51 KB
Volume
22
Category
Article
ISSN
0743-7463

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Direct Force Measurement of Comb Silicon
Direct Force Measurement of Comb Silicone Surfactants in Alcoholic Media by Atomic Force Microscopy
✍ Anfeng Wang; Liping Jiang; Guangzhao Mao; Yihan Liu πŸ“‚ Article πŸ“… 2001 πŸ› Elsevier Science 🌐 English βš– 128 KB

The interaction forces provided by silicone polyether (SPE) surfactants, adsorbed at the interface of octadecyltrichlorosilan monolayer and aqueous surfactant solution, were measured by atomic force microscopy. Changes in the forces in the presence of ethanol were examined for a series of comb-type