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Direct Topographic Measurement of Multilayers on Water by Atomic Force Microscopy

✍ Scribed by Dubreuil, Frédéric; Daillant, Jean; Guenoun, Patrick

Book ID: 126777514
Publisher: American Chemical Society
Year: 2003
Tongue: English
Weight: 396 KB
Volume: 19
Category: Article
ISSN: 0743-7463
DOI: 10.1021/la0343268

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