Spectroscopic characterization of the su
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Palacio, C.; Arranz, A.
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Article
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1999
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John Wiley and Sons
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English
โ 199 KB
Auger electron spectroscopy (AES), x-ray photoelectron spectroscopy (XPS), angle-resolved x-ray photoelectron spectroscopy (ARXPS), ion scattering spectroscopy (ISS) and factor analysis (FA) have been used to study the deposition of titanium on polycrystalline aluminium at room temperature. Analysis