A New Focused Ion Beam Optical System fo
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H. Shichi; S. Osabe; K. Kanehori
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Article
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1997
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John Wiley and Sons
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English
β 157 KB
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A new focused ion beam optical system that uses a liquid metal ion source was designed for a new secondary ion time-of-flight mass spectrometry instrument. This optical system consists mainly of two electrostatic lenses. The axial performance of the system was calculated to decide the design values