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Ion-optical system with energy filtering for sputtering neutral and secondary ion mass spectrometers

✍ Scribed by T.Ya. Fishkova; L.P. Ovsyannikova; S.V. Pasovets; E.V. Shpak


Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
176 KB
Volume
298
Category
Article
ISSN
0168-9002

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A new focused ion beam optical system that uses a liquid metal ion source was designed for a new secondary ion time-of-flight mass spectrometry instrument. This optical system consists mainly of two electrostatic lenses. The axial performance of the system was calculated to decide the design values