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Ion beam measurements of Sn/In ratios in indium tin oxide films prepared by pulsed-laser deposition

✍ Scribed by X.T. Ren; M.B. Huang; S. Amadon; W.A. Lanford; M.A. Morales Paliza; L.C. Feldman

Book ID: 114164383
Publisher: Elsevier Science
Year: 2001
Tongue: English
Weight: 172 KB
Volume: 174
Category: Article
ISSN: 0168-583X
DOI: 10.1016/s0168-583x(00)00437-7

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