Indium tin oxide (ITO) films were produced by low-energy oxygen ion beam assisted electron-beam evaporation. The dependence of surface morphology, electrical and optical properties on evaporation rate, oxygen ion beam energy and density, as well as substrate temperatures was characterized by atomic
Structural, electrical and optical properties of indium tin oxide films prepared by low-energy oxygen-ion-beam assisted deposition
β Scribed by C. Liu; T. Matsutani; T. Asanuma; M. Kiuchi
- Book ID
- 114167092
- Publisher
- Elsevier Science
- Year
- 2003
- Tongue
- English
- Weight
- 124 KB
- Volume
- 206
- Category
- Article
- ISSN
- 0168-583X
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## Abstract Indium tin oxide (ITO) films have been deposited onto glass substrates at room temperature by ion beam assisted deposition technique (IBAD) at different ion beam currents (80β120 mA). The effect of the ion beam current on films properties has been studied. The films prepared at low ion
Y 2 O 3 thin films were deposited by ion beam assisted deposition (IBAD) and the effects of fabrication parameters such as substrate temperature and ion energy on the structure, optical and electrical properties of the films were investigated. The results show that the deposited Y 2 O 3 films had le