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Investigations on the Si/SiO2 interface defects of silicon nanowires

✍ Scribed by Cui, L.; Xia, W.W.; Wang, F.; Yang, L.J.; Hu, Y.J.


Book ID
123594756
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
490 KB
Volume
409
Category
Article
ISSN
0921-4526

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