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Investigations of electron beam induced conductivity in silicon oxide thin films

✍ Scribed by S. S. Borisov; P. S. Vergeles; E. B. Yakimov

Book ID: 110203300
Publisher: Pleiades Publishing
Year: 2010
Tongue: English
Weight: 152 KB
Volume: 4
Category: Article
ISSN: 1027-4510
DOI: 10.1134/s1027451010050095

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