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Investigation of whisker defects on molecular beam epitaxy grown GaAs layers

✍ Scribed by N. J. Kadhim; D. Mukherjee

Publisher: Springer
Year: 1996
Tongue: English
Weight: 626 KB
Volume: 15
Category: Article
ISSN: 0261-8028
DOI: 10.1007/bf00240797

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