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Investigation of Trap States in AlInN/AlN/GaN Heterostructures by Frequency-Dependent Admittance Analysis

✍ Scribed by Engin Arslan; Serkan Bütün; Yasemin Şafak; Ekmel Ozbay


Book ID
107457041
Publisher
Springer US
Year
2010
Tongue
English
Weight
422 KB
Volume
39
Category
Article
ISSN
0361-5235

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