On the profile of frequency and voltage dependent interface states and series resistance in (Ni/Au)/Al0.22Ga0.78N/AlN/GaN heterostructures by using current–voltage (I–V) and admittance spectroscopy methods

✍ Scribed by S. Demirezen; Ş. Altındal; S. Özçelik; E. Özbay

• Book ID: 113800480
• Publisher: Elsevier Science
• Year: 2011
• Tongue: English
• Weight: 957 KB
• Volume: 51
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/j.microrel.2011.05.010