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Analysis of interface trap states in InAlN/AlN/GaN heterostructures

✍ Scribed by Zhou, Yang; Lin, Zhaojun; Luan, Chongbiao; Zhao, Jingtao; Yang, Qihao; Yang, Ming; Wang, Yutang; Feng, Zhihong; Lv, Yuanjie

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Simulation study of interface traps and

✍ Molnár, M.; Donoval, D.; Kuzmík, J.; Marek, J.; Chvála, A.; Príbytný, P.; Mikolá 📂 Article 📅 2014 🏛 Elsevier Science 🌐 English ⚖ 574 KB

Investigation of Trap States in AlInN/Al

✍ Engin Arslan; Serkan Bütün; Yasemin Şafak; Ekmel Ozbay 📂 Article 📅 2010 🏛 Springer US 🌐 English ⚖ 422 KB

Rapid hot-electron energy relaxation in

✍ Zhang, J.-Z.; Dyson, A.; Ridley, B. K. 📂 Article 📅 2013 🏛 American Institute of Physics 🌐 English ⚖ 687 KB

Measurement of interface trap states in

✍ Alexe, Marin 📂 Article 📅 1998 🏛 American Institute of Physics 🌐 English ⚖ 368 KB

On the temperature dependent profile of

✍ S. Demirezen; Ş. Altındal 📂 Article 📅 2010 🏛 Elsevier Science 🌐 English ⚖ 579 KB

Interface Electron Traps as a Source of

✍ Osvald, J. 📂 Article 📅 2013 🏛 Springer US 🌐 English ⚖ 393 KB