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Investigation of the delamination mechanism of the thin film dielectric structure in flip chip packages

โœ Scribed by C.C. Chiu; C.J. Huang; S.Y. Yang; C.C. Lee; K.N. Chiang


Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
724 KB
Volume
87
Category
Article
ISSN
0167-9317

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