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Investigation of silicon structures with periodically varying porosity by x-ray diffractometry methods

✍ Scribed by D. V. Irzhak; D. V. Roshchupkin; V. V. Starkov; R. R. Fakhrtdinov

Book ID
110203333
Publisher
Pleiades Publishing
Year
2010
Tongue
English
Weight
504 KB
Volume
4
Category
Article
ISSN
1027-4510

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## Abstract The dynamical theory of X‐ray diffraction by imperfect crystals with randomly distributed microdefects, applicable to double‐crystal diffractometry (DCD), has been extended to account for the simultaneous presence of several types of microdefects. The obtained formulae for coherent and