✦ LIBER ✦
Quantitative Powder X-ray Diffractometry Phase Analysis of Silicon Nitride Materials by a Multiline, Mean-Normalized-Intensity Method
✍ Scribed by Deyu Y. Li; Brian H. O'Connor; Qitao T. Chen; Marjan G. Zadnik
- Book ID
- 110826863
- Publisher
- John Wiley and Sons
- Year
- 1994
- Tongue
- English
- Weight
- 404 KB
- Volume
- 77
- Category
- Article
- ISSN
- 0002-7820
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