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Investigation of organic coatings and coating defects with the help of time-of-flight-secondary ion mass spectrometry (TOF-SIMS)

✍ Scribed by M Brenda; R Döring; U Schernau

Book ID: 114215709
Publisher: Elsevier Science
Year: 1999
Tongue: English
Weight: 174 KB
Volume: 35
Category: Article
ISSN: 0033-0655
DOI: 10.1016/s0300-9440(99)00035-1

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