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Investigation of Negative Gate Capacitance in MOS-Gated Power Devices

โœ Scribed by Long, Hong Yao; Sweet, Mark R.; Narayanan, Ekkanath Madathil Sankara


Book ID
121231502
Publisher
IEEE
Year
2012
Tongue
English
Weight
956 KB
Volume
59
Category
Article
ISSN
0018-9383

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