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Comprehensive Study on Negative Capacitance Effect Observed in MOS(n) Capacitors With Ultrathin Gate Oxides

✍ Scribed by Shu-Jau Chang; Jenn-Gwo Hwu

Book ID: 114620350
Publisher: IEEE
Year: 2011
Tongue: English
Weight: 372 KB
Volume: 58
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2010.2102033

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