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[IEEE 2009 International Conference on Emerging Trends in Electronic and Photonic Devices & Systems (ELECTRO-2009) - Varanasi (2009.12.22-2009.12.24)] 2009 International Conference on Emerging Trends in Electronic and Photonic Devices & Systems - A comparative study of surface quantization effects in Si and strained-Si MOS structures with ultrathin gate oxides

✍ Scribed by Dey, M.; Chattopadhyay, S.

Book ID: 125530454
Publisher: IEEE
Year: 2009
Weight: 365 KB
Category: Article
ISBN: 1424448468
DOI: 10.1109/ELECTRO.2009.5441175

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