✦ LIBER ✦

Investigation of ion-implanted semiconductors by ellipsometry and backscattering spectrometry

✍ Scribed by M. Fried; T. Lohner; E. Jároli; Gy. Vizkelethy; G. Mezey; J. Gyulai; M. Somogyi; H. Kerkow

No coin nor oath required. For personal study only.

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