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Investigation of dislocations by backscattering spectrometry and transmission electron microscopy

✍ Scribed by W.F. Tseng; J. Gyulai; T. Koji; S.S. Lau; J. Roth; J.W. Mayer

Publisher: Elsevier Science
Year: 1978
Weight: 360 KB
Volume: 149
Category: Article
ISSN: 0029-554X
DOI: 10.1016/0029-554x(78)90938-2

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