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Investigation of friction faces by the method of secondary ion-ion emission

โœ Scribed by V. P. Temnenko; A. K. Karaulov; S. P. Chenakin


Publisher
Springer
Year
1979
Tongue
English
Weight
162 KB
Volume
15
Category
Article
ISSN
1573-885X

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A series of ionic and neutral Group VIII transition metal complexes with molecular masses up to 2500 u were analysed by time-of-flight secondary ion mass spectrometry (SIMS) and plasma desorption mass spectrometry (PDMS). The secondary ion emission, the secondary ion yields and the yield ratios Y(PD