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Enhancement of the secondary ion emission induced by fast clusters

✍ Scribed by Fu-Rong Ding; Ping Shi; Rui Nie; Hong-Ji Ma

Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
186 KB
Volume
255
Category
Article
ISSN
0169-4332

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## Abstract Two ices, O~2~ and a mixture of O~2~ and N~2~, are bombarded by ^252^Cf fission fragments (FF) (∼65 MeV at target surface); the emitted positive and negative secondary ions are analyzed by time‐of‐flight mass spectrometry (TOF–SIMS). These studies shall enlighten sputtering from planeta