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Secondary ion emission from various metals and the semiconductors Si and GaAs induced by mega-electronvolt ion impact

✍ Scribed by R. Matthäus; R. Moshammer; G.v. Hayn; K. Wien; S. Della-Negra; Y. Le Beyec

Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
1024 KB
Volume
126
Category
Article
ISSN
0168-1176

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Secondary ion emission induced by fission fragment impact in CONH3 and CONH3H2O ices: modification in the CONH3 ice structure
✍ R. Martinez; L. S. Farenzena; P. Iza; C. R. Ponciano; M. G. P. Homem; A. Naves d 📂 Article 📅 2007 🏛 John Wiley and Sons 🌐 English ⚖ 538 KB

## Abstract CONH~3~ and CONH~3~–H~2~O ices at 25–130 K were bombarded by ^252^Cf fission fragments (∼65 MeV at the target surface) and the emitted secondary ions were analyzed by time‐of‐flight mass spectrometry (TOF‐SIMS). It is observed that the mass spectra obtained from both ices have similar