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Secondary ion emission from Langmuir-Blodgett (LB) films investigated by time-of-flight secondary ion mass spectrometry

✍ Scribed by M. Kudo; S. Yamada; S. Yoshida; T. Watanabe; T. Hoshi

Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 392 KB
Volume: 100-101
Category: Article
ISSN: 0169-4332
DOI: 10.1016/0169-4332(96)00272-3

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## Abstract Time of flight secondary ion mass spectrometry (ToF‐SIMS) is an ideal technique for the analysis of adsorbed protein films because of its surface sensitivity and chemical specificity. In this study, we examined ToF‐SIMS with the multivariate calibration method partial least squares regr