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A quantitative time-of-flight secondary ion mass spectrometry study of ion formation mechanisms using acid-base alternating Langmuir-Blodgett films

✍ Scribed by Jian-Xin Li; Joseph A. Gardella Jr.; Patrick J. McKeown

Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 929 KB
Volume: 90
Category: Article
ISSN: 0169-4332
DOI: 10.1016/0169-4332(95)00055-0

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