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Investigation of flicker noise and deep-levels in GaN/AlGaN transistors

✍ Scribed by A. Balandin; K. L. Wang; S. Cai; R. Li; C. R. Viswanathan; E. N. Wang; M. Wojtowicz

Book ID: 107452420
Publisher: Springer US
Year: 2000
Tongue: English
Weight: 141 KB
Volume: 29
Category: Article
ISSN: 0361-5235
DOI: 10.1007/s11664-000-0066-8

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