Influence of surface passivation on low-
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Vitusevich, S. A. ;Petrychuk, M. V. ;Danylyuk, S. V. ;Kurakin, A. M. ;Klein, N.
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Article
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2005
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John Wiley and Sons
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English
⚖ 208 KB
## Abstract We investigated low‐frequency noise in passivated and nonpassivated AlGaN/GaN high electron mobility transistor (HEMT) heterostructures grown on SiC substrate. The heterostructure layers are grown without intentionally doping the barrier material and two‐dimensional gas appears at the i