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Investigation of deep level transient spectroscopy (DLTS) of dopant ZnO-based varistors

โœ Scribed by A.H. Ammar; A.A.M. Farag


Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
491 KB
Volume
405
Category
Article
ISSN
0921-4526

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โœฆ Synopsis


This work shows that the use of conventional analytical procedures to investigate the deep centers from the deep levels transient spectroscopy (DLTS) for ZnO varistors doped with single, double and ternary dopants of Bi 2 O 3 , CoO and MnO 2 . This is to clarify the effect of these doping atoms on the conductivity of ZnO varistors. The results showed that the doping with Bi 2 O 3 + CoO leads to a decrease in the conductivity while doping with Bi 2 O 3 +MnO 2 increased the conductivity and the three dopants together showed a compensating effect. The DLTS characterizing parameters such as minority-carrier capture cross-section, s, effective density of states in the minority-carrier band, N D , energy separation between the trap level and the minority-carrier band, DE t and electron trap density, N t for each doped varistor were also calculated.


๐Ÿ“œ SIMILAR VOLUMES


Deep level transient spectroscopy (DLTS)
โœ C. Nyamhere; A.G.M. Das; F.D. Auret; A. Chawanda; C.A. Pineda-Vargas; A. Venter ๐Ÿ“‚ Article ๐Ÿ“… 2011 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 373 KB

Deep level transient spectroscopy (DLTS) and Laplace-DLTS have been used to investigate the defects created in Sb doped Ge after irradiation with 2 MeV protons having a fluence of 1 ร‚ 10 13 protons/cm 2 . The results show that proton irradiation resulted in primary hole traps at E V รพ0.15 and E V รพ