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Investigation of deep level defects in copper irradiated bipolar junction transistor

✍ Scribed by K.V. Madhu; Ravi Kumar; M. Ravindra; R. Damle

Book ID: 108271677
Publisher: Elsevier Science
Year: 2008
Tongue: English
Weight: 443 KB
Volume: 52
Category: Article
ISSN: 0038-1101
DOI: 10.1016/j.sse.2008.06.001

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