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DLTS Studies of bias dependence of defects in silicon NPN bipolar junction transistor irradiated by heavy ions

✍ Scribed by Chaoming Liu; Xingji Li; Hongbin Geng; Erming Rui; Jianqun Yang; Liyi Xiao

Book ID: 116789777
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 335 KB
Volume: 688
Category: Article
ISSN: 0168-9002
DOI: 10.1016/j.nima.2012.05.073

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