Annealing effects and DLTS study on NPN silicon bipolar junction transistors irradiated by heavy ions

✍ Scribed by Liu, Chaoming; Li, Xingji; Yang, Jianqun; Rui, Erming

• Book ID: 121743236
• Publisher: Elsevier Science
• Year: 2014
• Tongue: English
• Weight: 497 KB
• Volume: 735
• Category: Article
• ISSN: 0168-9002
• DOI: 10.1016/j.nima.2013.09.048