𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Investigation of beam effect on porous silicon

✍ Scribed by E Kótai; F Pászti; E Szilágyi


Book ID
114171881
Publisher
Elsevier Science
Year
2000
Tongue
English
Weight
152 KB
Volume
161-163
Category
Article
ISSN
0168-583X

No coin nor oath required. For personal study only.


📜 SIMILAR VOLUMES


Effect of drying on porous silicon
✍ M. Bouchaour; A. Ould-Abbas; N. Diaf; N. Chabane Sari 📂 Article 📅 2004 🏛 Springer Netherlands 🌐 English ⚖ 785 KB
Pore structure investigations in porous
✍ F Pászti; E Szilágyi 📂 Article 📅 1998 🏛 Elsevier Science 🌐 English ⚖ 728 KB

Ion beam analytical methods (e.g. Rutherford Backscattering, RBS, Elastic Recoil Detection, ERD, or Nuclear Reaction Analysis, NRA) are widely used for quantitative determination of the depth distribution of elements. In porous samples however, where the diameter of the pores is a few tens of nm (i.

Acoustic investigation of porous silicon
✍ R. J. M. Fonseca; J. M. Saurel; A. Foucaran; J. Camassel; E. Massone; T. Talierc 📂 Article 📅 1995 🏛 Springer 🌐 English ⚖ 450 KB

Porous silicon (PS) layers are formed on p+-type silicon wafers by electrochemical anodization in hydrofluoric acid solutions. Microechography and acoustic signature, V(z), have been performed at 1.5 GHz and 600 MHz, respectively, in order to study the elastic properties of PS layers. The thicknesse