A modified method of lines MMoL is de¨eloped to analyze open microstrip structures with finite metallization thickness and conducti¨ity. The integration along the normal of the interface between the conductor and dielectric is analytically integrated before the method ( ) of lines transform. The per
Investigation of asymmetrical coupled microstrip lines with finite metallization thickness
✍ Scribed by Nam-Il Yun; Ic-Pyo Hong; Han-Kyu Park
- Publisher
- John Wiley and Sons
- Year
- 2000
- Tongue
- English
- Weight
- 106 KB
- Volume
- 28
- Category
- Article
- ISSN
- 0895-2477
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