Modified method of lines for open microstrip structures with finite metallization thickness and conductivity

✍ Scribed by N. N. Feng; G. R. Zhou; D. G. Fang

• Publisher: John Wiley and Sons
• Year: 1999
• Tongue: English
• Weight: 143 KB
• Volume: 21
• Category: Article
• ISSN: 0895-2477
• DOI: 10.1002/(sici)1098-2760(19990405)21:1<60::aid-mop17>3.0.co;2-9

✦ Synopsis

A modified method of lines MMoL is de¨eloped to analyze open microstrip structures with finite metallization thickness and conducti¨ity. The integration along the normal of the interface between the conductor and dielectric is analytically integrated before the method ( ) of lines transform. The periodic boundary conditions PBC are employed to simulate the open structure. Due to the uniform discretization which leads to the analytical form of eigen¨alues and the application of ( ) the fast Fourier transform FFT technique, our approach can reduce the computation time significantly. The comparison between our results and published theoretical or experimental ones shows the accuracy and efficiency of this method.