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Inverse modeling of two-dimensional MOSFET dopant profile via capacitance of the source/drain gated diode

✍ Scribed by Chiang, C.Y.T.; Yeow, Y.T.


Book ID
114538207
Publisher
IEEE
Year
2000
Tongue
English
Weight
273 KB
Volume
47
Category
Article
ISSN
0018-9383

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