✦ LIBER ✦
Two-dimensional doping profile characterization of MOSFETs by inverse modeling using I-V characteristics in the subthreshold region
✍ Scribed by Lee, Z.K.; McIlrath, M.B.; Antoniadis, D.A.
- Book ID
- 114537813
- Publisher
- IEEE
- Year
- 1999
- Tongue
- English
- Weight
- 251 KB
- Volume
- 46
- Category
- Article
- ISSN
- 0018-9383
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